Testing an Exponential Delay Time model against a Random Sign Censoring model in Reliability

AuthorsSarah Jomhoori,Dauxois Jean-Yves,Fatemeh Yousefzadeh
JournalJournal de la societe Francaise de statistique
Page number104-119
Serial number155
Volume number3
Paper TypeFull Paper
Published At2014
Journal GradeISI
Journal TypeTypographic
Journal CountryIran, Islamic Republic Of
Journal IndexWOS

Abstract